X-Ray Based Subpicosecond Electron Bunch Characterization Using 90° Thomson Scattering

W. P. Leemans; R. W. Schoenlein; P. Volfbeyn; A. H. Chin; T. E. Glover; P. Balling; M. Zolotorev; K. J. Kim; S. Chattopadhyay; C. V. Shank

doi:10.1103/PhysRevLett.77.4182

X-Ray Based Subpicosecond Electron Bunch Characterization Using 90° Thomson Scattering

W. P. Leemans, R. W. Schoenlein, P. Volfbeyn, A. H. Chin, T. E. Glover, P. Balling, M. Zolotorev, K. J. Kim, S. Chattopadhyay, and C. V. Shank

Phys. Rev. Lett. 77, 4182 – Published 11 November 1996

Abstract

X rays produced by 90° Thomson scattering of a femtosecond, near infrared, terawatt laser pulse of a 50 MeV electron beam are shown to be an effective diagnostic to measure transverse and longitudinal density distributions of an electron beam ( $e$ beam) with subpicosecond time resolution. The laser beam was focused onto the $e$ -beam waist, generating 30 keV x rays in the forward direction. The transverse and longitudinal $e$ -beam structures have been obtained by measuring the intensity of the x-ray beam, while scanning the laser beam across the $e$ beam in space and time. The $e$ -beam divergence has been obtained through measurement of spatial and spectral characteristics of the scattered x-ray beam.

Received 17 June 1996

DOI:https://doi.org/10.1103/PhysRevLett.77.4182

Authors & Affiliations

W. P. Leemans¹, R. W. Schoenlein¹, P. Volfbeyn¹, A. H. Chin², T. E. Glover¹, P. Balling¹, M. Zolotorev¹, K. J. Kim¹, S. Chattopadhyay¹, and C. V. Shank^1,2

¹Ernest Orlando Lawrence Berkeley National Laboratory, University of California at Berkeley, Berkeley, California 94720
²Physics Department, University of California at Berkeley, Berkeley, California 94720