Mesoscopic Capacitors: A Statistical Analysis

Víctor A. Gopar, Pier A. Mello, and Markus Büttiker
Phys. Rev. Lett. 77, 3005 – Published 30 September 1996; Erratum Phys. Rev. Lett. 77, 4974 (1996)
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Abstract

The capacitance of mesoscopic samples depends on their geometry and physical properties, described in terms of characteristic times scales. The resulting ac admittance shows sample to sample fluctuations. Their distribution is studied here—through a random-matrix model—for a chaotic cavity capacitively coupled to a backgate: it is observed from the distribution of scattering time delays for the cavity, which is found analytically for the orthogonal, unitary, and symplectic universality classes, one mode in the lead connecting the cavity to the reservoir and no direct scattering. The results agree with numerical simulations.

  • Received 1 May 1996

DOI:https://doi.org/10.1103/PhysRevLett.77.3005

©1996 American Physical Society

Erratum

Mesoscopic Capacitors: A Statistical Analysis

Victor A. Gopar, Pier A. Mello, and Markus Büttiker
Phys. Rev. Lett. 77, 4974 (1996)

Authors & Affiliations

Víctor A. Gopar1, Pier A. Mello1, and Markus Büttiker2

  • 1Instituto de Física, Universidad Nacional Autónoma de México, 01000 México, D.F., México
  • 2Département de Physique Théorique, Université de Genève, CH-1211 Genève 4, Switzerland

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Vol. 77, Iss. 14 — 30 September 1996

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