Observation of Hot-Electron Shot Noise in a Metallic Resistor

Andrew H. Steinbach, John M. Martinis, and Michel H. Devoret
Phys. Rev. Lett. 76, 3806 – Published 13 May 1996
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Abstract

We have measured the current noise of silver thin-film resistors as a function of current and temperature and for resistor lengths of 7000, 100, 30, and 1μm. As the resistor becomes shorter than the electron-phonon interaction length, the current noise for large current increases from a nearly current independent value to the interacting hot-electron value (3/4)2eI. However, further reduction in length below the electron-electron interaction length decreases the noise to a value approaching the independent hot-electron value (1/3)2eI first predicted for mesoscopic resistors.

  • Received 12 January 1996

DOI:https://doi.org/10.1103/PhysRevLett.76.3806

©1996 American Physical Society

Authors & Affiliations

Andrew H. Steinbach and John M. Martinis

  • National Institute of Standards and Technology, Boulder, Colorado 80303

Michel H. Devoret

  • Service de Physique de l'Etat Condensé, Commissariat à l'Energie Atomique Saclay, F-91191 Gif-sur-Yvette Cedex, France

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Issue

Vol. 76, Iss. 20 — 13 May 1996

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