Abstract
We have measured the current noise of silver thin-film resistors as a function of current and temperature and for resistor lengths of , , , and . As the resistor becomes shorter than the electron-phonon interaction length, the current noise for large current increases from a nearly current independent value to the interacting hot-electron value . However, further reduction in length below the electron-electron interaction length decreases the noise to a value approaching the independent hot-electron value first predicted for mesoscopic resistors.
- Received 12 January 1996
DOI:https://doi.org/10.1103/PhysRevLett.76.3806
©1996 American Physical Society