Demonstration of Emittance Compensation through the Measurement of the Slice Emittance of a 10-ps Electron Bunch

X. Qiu, K. Batchelor, I. Ben-Zvi, and X-J. Wang
Phys. Rev. Lett. 76, 3723 – Published 13 May 1996
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Abstract

The beam matrix of a picosecond long slice of an electron bunch was measured. A short slice is selected out of an energy chirped beam by a slit in a dispersive region. The emittance is measured using the quadrupole scan technique. We observe the process of emittance compensation of the beam by repeating the measurement for various values of the compensating solenoid and for several slices.

  • Received 23 October 1995

DOI:https://doi.org/10.1103/PhysRevLett.76.3723

©1996 American Physical Society

Authors & Affiliations

X. Qiu, K. Batchelor, I. Ben-Zvi, and X-J. Wang

  • National Synchrotron Light Source Department, Brookhaven National Laboratory, Upton, New York 11973

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Issue

Vol. 76, Iss. 20 — 13 May 1996

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