Abstract
Soft-x-ray photoemission measurements of the bulk Si 2p core level in Si/ overlayer structures show that hot-electron transport in is essentially independent of temperature between 300 and 980 K. These results reveal a basic failure of the semiclassical Monte Carlo formalism to correctly model the strong electron-phonon interaction in at electron energies >6 eV. The experimental data are shown to be consistent with the trends seen in quantum Monte Carlo transport calculations.
- Received 18 June 1992
DOI:https://doi.org/10.1103/PhysRevLett.69.1407
©1992 American Physical Society