Forces on charged defects in semiconductor heterostructures

J. Tersoff
Phys. Rev. Lett. 65, 887 – Published 13 August 1990
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Abstract

The forces on dopant impurities and other defects are crucial in determining defect motion and diffusion in semiconductor heterostructures. Impurity ions and other charged defects feel electrostatic forces, just as electrons do. However, at heterojunction interfaces, electrons feel additional forces associated with band-edge distontinuities. Here, the analogous forces for ions and charged defects are derived, and given a simple physical interpretation. The donor or acceptor level is found to play much the same role for the ion that the band edge plays for the electron or hole in defining the effective potential. These forces can in general be spatially discontinuous, because of their dependence on charge state.

  • Received 9 April 1990

DOI:https://doi.org/10.1103/PhysRevLett.65.887

©1990 American Physical Society

Authors & Affiliations

J. Tersoff

  • IBM Research Division, Thomas J. Watson Research Center, Yorktown Heights, New York 10598

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Issue

Vol. 65, Iss. 7 — 13 August 1990

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