Theory for the Atomic Force Microscopy of Deformable Surfaces

D. Tománek, G. Overney, H. Miyazaki, S. D. Mahanti, and H. J. Güntherodt
Phys. Rev. Lett. 63, 876 – Published 21 August 1989; Erratum Phys. Rev. Lett. 63, 1896 (1989)
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Abstract

We present a theory for the atomic force microscopy (AFM) of deformable surfaces and apply it to graphite with and without intercalated atoms. Using continuum elasticity theory for graphite layers, with parameters obtained from ab initio calculations, we determine quantitatively local distortions in the vicinity of a sharp AFM tip as a function of the applied force. Our calculations show that AFM should be a unique tool to determine local surface rigidity and to measure the healing length of graphite in the vicinity of intercalated impurities or steps.

  • Received 7 June 1989

DOI:https://doi.org/10.1103/PhysRevLett.63.876

©1989 American Physical Society

Erratum

Theory for the Atomic Force Microscopy of Deformable Surfaces

D. Tománek, G. Overney, H. Miyazaki, S. D. Mahanti, and H. J. Güntherodt
Phys. Rev. Lett. 63, 1896 (1989)

Authors & Affiliations

D. Tománek, G. Overney*, H. Miyazaki, and S. D. Mahanti

  • Department of Physics and Astronomy and Center for Fundamental Materials Research, Michigan State University, East Lansing, Michigan 48824-1116

H. J. Güntherodt

  • Department of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, Switzerland

  • *Permanent address: Institut für Physik, Universität Basel, Klingelbergstrasse 82, CH-4056 Basel, Switzerland.
  • Permanent address: Department of Applied Physics, Tohoku University, Sendai, Japan.

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Vol. 63, Iss. 8 — 21 August 1989

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