Origins of stress on elemental and chemisorbed semiconductor surfaces

Robert D. Meade and David Vanderbilt
Phys. Rev. Lett. 63, 1404 – Published 25 September 1989
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Abstract

First-principles calculations of stress and energy have been performed on 1×1 substitutional and √3 × √3 adatom-covered Si(111) and Ge(111) surfaces, using a variety of column-III, -IV, and -V adsorbates. Trends in surface stresses are understood in terms of three contributing factors: the relative atomic size of the adsorbate and substrate atoms, the chemical nature of the adsorbate species, and the bonding topology of the surface reconstruction.

  • Received 19 June 1989

DOI:https://doi.org/10.1103/PhysRevLett.63.1404

©1989 American Physical Society

Authors & Affiliations

Robert D. Meade and David Vanderbilt

  • Lyman Laboratory of Physics, Harvard University, Cambridge, Massachusetts 02138

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Issue

Vol. 63, Iss. 13 — 25 September 1989

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