Abstract
We show that scanning tunneling microscopy (STM) images can be dominated by elastic deformations induced by atomic forces between tip and surface. New STM experiments on graphite (0001) showing a strong variation of the giant corrugation amplitudes with varying current at constant voltage are direct evidence of this atomic-force concept. Corrugations up to 8 ÅA on a lateral scale of 2.4 Å are associated with forces up to N for compression and 2 × N for expansion.
- Received 28 April 1986
DOI:https://doi.org/10.1103/PhysRevLett.57.444
©1986 American Physical Society