Anomalous Corrugations in Scanning Tunneling Microscopy: Imaging of Individual States

J. Tersoff
Phys. Rev. Lett. 57, 440 – Published 28 July 1986
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Abstract

Unusual corrugations observed in scanning-tunneling-microscope (STM) images of 1TTaS2, Si(111)(2×1), and graphite are explained, and are shown to be characteristic of materials where the Fermi surface has collapsed to a point at the corner of the surface Brillouin zone. This is the first clear case where the low-bias STM image is dominated by electronic structure effects rather than surface geometry. Implications for STM spatial resolution are discussed.

  • Received 24 January 1986

DOI:https://doi.org/10.1103/PhysRevLett.57.440

©1986 American Physical Society

Authors & Affiliations

J. Tersoff

  • IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598

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Issue

Vol. 57, Iss. 4 — 28 July 1986

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