Abstract
Unusual corrugations observed in scanning-tunneling-microscope (STM) images of , Si(111)(2×1), and graphite are explained, and are shown to be characteristic of materials where the Fermi surface has collapsed to a point at the corner of the surface Brillouin zone. This is the first clear case where the low-bias STM image is dominated by electronic structure effects rather than surface geometry. Implications for STM spatial resolution are discussed.
- Received 24 January 1986
DOI:https://doi.org/10.1103/PhysRevLett.57.440
©1986 American Physical Society