Abstract
The scanning tunneling microscope is proposed as a method to measure forces as small as N. As one application for this concept, we introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale. The atomic force microscope is a combination of the principles of the scanning tunneling microscope and the stylus profilometer. It incorporates a probe that does not damage the surface. Our preliminary results in air demonstrate a lateral resolution of 30 ÅA and a vertical resolution less than 1 Å.
- Received 5 December 1985
DOI:https://doi.org/10.1103/PhysRevLett.56.930
©1986 American Physical Society
Collections
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Letters from the Past - A PRL Retrospective
2008 marked PRL’s 50th anniversary. As part of the celebrations a collection of milestone Letters was started. The collection contains Letters that have made long-lived contributions to physics, either by announcing significant discoveries, or by initiating new areas of research.
Scanning Probe Microscopy: From Sublime to Ubiquitous
This collection marks the 35th anniversary of scanning tunneling microscopy (STM) and the 30th anniversary of atomic force microscopy (AFM). These papers, all published in the Physical Review journals, highlight the positive impact that STM and AFM have had, and continue to have, on physical science research. The papers included in the collection have been made free to read.
Focus
FocusLandmarks—Atomic Force Microscope Makes Angstrom-Scale Images
Published 21 September 2012
The atomic force microscope, introduced in 1986, provided atomic-scale pictures of surfaces, with few limitations on the type of sample.
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