Pinning and Roughening of Domain Walls in Ising Systems Due to Random Impurities

David A. Huse and Christopher L. Henley
Phys. Rev. Lett. 54, 2708 – Published 24 June 1985
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Abstract

Randomly placed impurities that alter the local exchange couplings, but do not generate random fields or destroy the long-range order, roughen domain walls in Ising systems for dimensionality 53<d<5. They also pin (localize) the walls in energetically favorable positions. This drastically slows down the kinetics of ordering. The pinned domain wall is a new critical phenomenon governed by a zero-temperature fixed point. For d=2, the critical exponents for domain-wall pinning energies and roughness as a function of length scale are estimated from numerically generated ground states.

  • Received 12 April 1985

DOI:https://doi.org/10.1103/PhysRevLett.54.2708

©1985 American Physical Society

Authors & Affiliations

David A. Huse and Christopher L. Henley

  • AT&T Bell Laboratories, Murray Hill, New Jersey 07974

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Issue

Vol. 54, Iss. 25 — 24 June 1985

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