Electronic Transport in Amorphous Silicon Films

P. G. Le Comber and W. E. Spear
Phys. Rev. Lett. 25, 509 – Published 24 August 1970
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Abstract

Drift mobility and conductivity measurements were made between 290 and 85°K on amorphous silicon specimens prepared by glow-discharge decomposition of silane. The results suggest that excess electrons drift in the extended states with a mobility of about 10 cm2 sec1 V1. At lower temperatures, phonon-assisted hopping occurs through localized states occupying a range of 0.2 eV below the extended states. Conductivity results also suggest hopping transport near the Fermi energy.

  • Received 25 May 1970

DOI:https://doi.org/10.1103/PhysRevLett.25.509

©1970 American Physical Society

Authors & Affiliations

P. G. Le Comber and W. E. Spear

  • Carnegie Laboratory of Physics, The University, Dundee, Scotland

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Issue

Vol. 25, Iss. 8 — 24 August 1970

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