Microscopic Model for Cyclic Voltammetry of Porous Electrodes

Yiting Lin, Cheng Lian, Mikel Unibaso Berrueta, Honglai Liu, and René van Roij
Phys. Rev. Lett. 128, 206001 – Published 18 May 2022
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Abstract

Cyclic voltammetry (CV) is a widespread experimental technique for characterizing electrochemical devices such as supercapacitors. Despite its wide use, a quantitative relation between CV and microscopic properties of supercapacitors is still lacking. In this Letter, we use both the microscopic “stack-electrode” model and its equivalent circuit for predicting the cyclic voltammetry of electric double-layer formation in porous electrodes. We find that the dimensionless combination ωτn, with ω the scan frequency of the time-dependent potential and τn the relaxation timescale of the stack-electrode model, governs the CV curves and capacitance: the capacitance is scan-rate independent for ωτn1 and scan-rate dependent for ωτn1. With a single fit parameter and all other model parameters dictated by experiments, our model reproduces experimental CV curves over a wide range of ω. Meanwhile, the influence of the pore size distribution on the charging dynamics is investigated to explain the experimental data.

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  • Received 3 March 2022
  • Accepted 13 April 2022

DOI:https://doi.org/10.1103/PhysRevLett.128.206001

© 2022 American Physical Society

Physics Subject Headings (PhySH)

General PhysicsStatistical Physics & ThermodynamicsCondensed Matter, Materials & Applied PhysicsPolymers & Soft Matter

Authors & Affiliations

Yiting Lin1, Cheng Lian1,*, Mikel Unibaso Berrueta2, Honglai Liu1, and René van Roij2

  • 1State Key Laboratory of Chemical Engineering, Shanghai Engineering Research Center of Hierarchical Nanomaterials, School of Chemistry and Molecular Engineering, East China University of Science and Technology, Shanghai 200237, China
  • 2Institute for Theoretical Physics, Center for Extreme Matter and Emergent Phenomena, Utrecht University, Princetonplein 5, 3584 CC Utrecht, Netherlands

  • *liancheng@ecust.edu.cn

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Issue

Vol. 128, Iss. 20 — 20 May 2022

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