Quantum Metrology for Non-Markovian Processes

Anian Altherr and Yuxiang Yang
Phys. Rev. Lett. 127, 060501 – Published 2 August 2021
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Abstract

Quantum metrology is a rapidly developing branch of quantum technologies. While various theories have been established on quantum metrology for Markovian processes, i.e., quantum channel estimation, quantum metrology for non-Markovian processes is much less explored. In this Letter, we establish a general framework of non-Markovian quantum metrology. For any parametrized non-Markovian process on a finite-dimensional system, we derive a formula for the maximal amount of quantum Fisher information that can be extracted from it by an optimally controlled probe state. In addition, we design an algorithm that evaluates this quantum Fisher information via semidefinite programming. We apply our framework to noisy frequency estimation, where we find that the optimal performance of quantum metrology is better in the non-Markovian scenario than in the Markovian scenario and explore the possibility of efficient sensing via simple variational circuits.

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  • Received 8 March 2021
  • Revised 1 May 2021
  • Accepted 1 July 2021

DOI:https://doi.org/10.1103/PhysRevLett.127.060501

© 2021 American Physical Society

Physics Subject Headings (PhySH)

Quantum Information, Science & Technology

Authors & Affiliations

Anian Altherr1,* and Yuxiang Yang1,2,†

  • 1Institute for Theoretical Physics, ETH Zürich, 8093 Zürich, Switzerland
  • 2QICI Quantum Information and Computation Initiative, Department of Computer Science, The University of Hong Kong, Pokfulam Road, Hong Kong

  • *aaltherr@ethz.ch
  • yangyu@ethz.ch

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Issue

Vol. 127, Iss. 6 — 6 August 2021

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