• Open Access

Heating of a Trapped Ion Induced by Dielectric Materials

Markus Teller, Dario A. Fioretto, Philip C. Holz, Philipp Schindler, Viktor Messerer, Klemens Schüppert, Yueyang Zou, Rainer Blatt, John Chiaverini, Jeremy Sage, and Tracy E. Northup
Phys. Rev. Lett. 126, 230505 – Published 11 June 2021
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Abstract

Electric-field noise due to surfaces disturbs the motion of nearby trapped ions, compromising the fidelity of gate operations that are the basis for quantum computing algorithms. We present a method that predicts the effect of dielectric materials on the ion’s motion. Such dielectrics are integral components of ion traps. Quantitative agreement is found between a model with no free parameters and measurements of a trapped ion in proximity to dielectric mirrors. We expect that this approach can be used to optimize the design of ion-trap-based quantum computers and network nodes.

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  • Received 26 March 2021
  • Accepted 17 May 2021

DOI:https://doi.org/10.1103/PhysRevLett.126.230505

Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI.

Published by the American Physical Society

Physics Subject Headings (PhySH)

Quantum Information, Science & Technology

Authors & Affiliations

Markus Teller1, Dario A. Fioretto1, Philip C. Holz1,2, Philipp Schindler1, Viktor Messerer1, Klemens Schüppert1, Yueyang Zou1, Rainer Blatt1,3, John Chiaverini4,5, Jeremy Sage4,5, and Tracy E. Northup1,*

  • 1Institut für Experimentalphysik, Universität Innsbruck, Technikerstrasse 25, 6020 Innsbruck, Austria
  • 2Alpine Quantum Technologies GmbH, Technikerstrasse 17/1, 6020 Innsbruck, Austria
  • 3Institut für Quantenoptik und Quanteninformation, Österreichische Akademie der Wissenschaften, Technikerstrasse 21 A, 6020 Innsbruck, Austria
  • 4Lincoln Laboratory, Massachusetts Institute of Technology, Lexington, Massachusetts 02421, USA
  • 5Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA

  • *Corresponding author. tracy.northup@uibk.ac.at

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Issue

Vol. 126, Iss. 23 — 11 June 2021

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