Metrological Detection of Multipartite Entanglement from Young Diagrams

Zhihong Ren, Weidong Li, Augusto Smerzi, and Manuel Gessner
Phys. Rev. Lett. 126, 080502 – Published 25 February 2021
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Abstract

We characterize metrologically useful multipartite entanglement by representing partitions with Young diagrams. We derive entanglement witnesses that are sensitive to the shape of Young diagrams and show that Dyson’s rank acts as a resource for quantum metrology. Common quantifiers, such as the entanglement depth and k-separability are contained in this approach as the diagram’s width and height. Our methods are experimentally accessible in a wide range of atomic systems, as we illustrate by analyzing published data on the quantum Fisher information and spin-squeezing coefficients.

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  • Received 7 December 2020
  • Accepted 13 January 2021

DOI:https://doi.org/10.1103/PhysRevLett.126.080502

© 2021 American Physical Society

Physics Subject Headings (PhySH)

Quantum Information, Science & Technology

Authors & Affiliations

Zhihong Ren1,2, Weidong Li1,*, Augusto Smerzi1,3,†, and Manuel Gessner2,‡

  • 1Institute of Theoretical Physics and Department of Physics, State Key Laboratory of Quantum Optics and Quantum Optics Devices, Collaborative Innovation Center of Extreme Optics, Shanxi University, Taiyuan 030006, China
  • 2Laboratoire Kastler Brossel, ENS-Université PSL, CNRS, Sorbonne Université, Collège de France, 24 Rue Lhomond, 75005 Paris, France
  • 3QSTAR, INO-CNR, and LENS, Largo Enrico Fermi 2, 50125 Firenze, Italy

  • *wdli@sxu.edu.cn
  • augusto.smerzi@ino.it
  • manuel.gessner@ens.fr

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Issue

Vol. 126, Iss. 8 — 26 February 2021

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