Continuous-Variable Entanglement Test in Driven Quantum Contacts

Hongxin Zhan, Mihajlo Vanević, and Wolfgang Belzig
Phys. Rev. Lett. 122, 236801 – Published 12 June 2019
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Abstract

The standard entanglement test using the Clauser-Horne-Shimony-Holt inequality is known to fail in mesoscopic junctions at finite temperatures. Since this is due to the bidirectional particle flow, a similar failure is expected to occur in an ac-driven contact. We develop a continuous-variable entanglement test suitable for electrons and holes that are created by the ac drive. At low enough temperatures the generalized Bell inequality is violated in junctions with low conductance or a small number of transport channels and with ac voltages which create few electron-hole pairs per cycle. Our ac-entanglement test depends on the total number of electron-hole pairs and on the distribution of probabilities of pair creations similar to the Fano factor.

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  • Received 12 January 2018
  • Revised 17 March 2019

DOI:https://doi.org/10.1103/PhysRevLett.122.236801

© 2019 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Hongxin Zhan1, Mihajlo Vanević2, and Wolfgang Belzig1

  • 1Fachbereich Physik, Universität Konstanz, D-78457 Konstanz, Germany
  • 2Department of Physics, University of Belgrade, 11158 Belgrade, Serbia

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Issue

Vol. 122, Iss. 23 — 14 June 2019

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