Measurement of Mechanical Deformations Induced by Enhanced Electromagnetic Stress on a Parallel Metallic-Plate System

M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan
Phys. Rev. Lett. 121, 035502 – Published 17 July 2018
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Abstract

We measured the electromagnetic stress-induced local strain distribution on a centimeter-sized parallel-plate metallic resonant unit illuminated with microwave radiation. Using a fiber interferometer, we found that the strain changes sign across the resonant unit, in agreement with theoretical predictions that the attractive electric and repulsive magnetic forces act at different locations. The enhancement of the corresponding maximum local electromagnetic stress is stronger than the enhancement of the net force, reaching a factor of >600 compared to the ordinary radiation pressure.

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  • Received 28 March 2018

DOI:https://doi.org/10.1103/PhysRevLett.121.035502

© 2018 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

M. Wang1,2, S. Wang1,3, Q. Zhang1,2, C. T. Chan1, and H. B. Chan1,2,*

  • 1Department of Physics, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong, China
  • 2William Mong Institute of Nano Science and Technology, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong, China
  • 3Department of Physics, City University of Hong Kong, Tat Chee Avenue, Kowloon, Hong Kong, China

  • *hochan@ust.hk

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Issue

Vol. 121, Iss. 3 — 20 July 2018

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