Field-Embedded Particles Driven by Active Flips

Ruben Zakine, Jean-Baptiste Fournier, and Frédéric van Wijland
Phys. Rev. Lett. 121, 028001 – Published 10 July 2018
PDFHTMLExport Citation

Abstract

Systems of independent active particles embedded into a fluctuating environment are relevant to many areas of soft-matter science. We use a minimal model of noninteracting spin-carrying Brownian particles in a Gaussian field and show that activity-driven spin dynamics leads to patterned order. We find that the competition between mediated interactions and active noise alone can yield such diverse behaviors as phase transitions and microphase separation, from lamellar up to hexagonal ordering of clusters of opposite magnetization. These rest on complex multibody interactions. We find regimes of stationary patterns, but also dynamical regimes of relentless birth and growth of lumps of magnetization opposite of the surrounding one. Our approach combines Monte Carlo simulations with analytical methods based on dynamical density functional approaches.

  • Figure
  • Figure
  • Figure
  • Received 22 January 2018
  • Revised 6 April 2018

DOI:https://doi.org/10.1103/PhysRevLett.121.028001

© 2018 American Physical Society

Physics Subject Headings (PhySH)

Statistical Physics & ThermodynamicsPolymers & Soft Matter

Authors & Affiliations

Ruben Zakine, Jean-Baptiste Fournier, and Frédéric van Wijland

  • Laboratoire Matière et Systèmes Complexes (MSC), Université Paris Diderot, USPC, UMR 7057 CNRS, F-75205 Paris, France

Article Text (Subscription Required)

Click to Expand

Supplemental Material (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 121, Iss. 2 — 13 July 2018

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×