Abstract
An absolute scale match between experiment and simulation in atomic-resolution off-axis electron holography is demonstrated, with unknown experimental parameters determined directly from the recorded electron wave function using an automated numerical algorithm. We show that the local thickness and tilt of a pristine thin flake can be measured uniquely, whereas some electron optical aberrations cannot be determined unambiguously for a periodic object. The ability to determine local specimen and imaging parameters directly from electron wave functions is of great importance for quantitative studies of electrostatic potentials in nanoscale materials, in particular when performing in situ experiments and considering that aberrations change over time.
- Received 30 January 2018
DOI:https://doi.org/10.1103/PhysRevLett.120.156101
© 2018 American Physical Society
Physics Subject Headings (PhySH)
Synopsis
Getting More out of Electron Microscopy
Published 11 April 2018
A new analysis technique allows researchers to extract atomic-resolution holographic images of materials using a transmission electron microscope.
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