Stochastic Model of Breakdown Nucleation under Intense Electric Fields

Eliyahu Zvi Engelberg, Yinon Ashkenazy, and Michael Assaf
Phys. Rev. Lett. 120, 124801 – Published 20 March 2018
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Abstract

A plastic response due to dislocation activity under intense electric fields is proposed as a source of breakdown. A model is formulated based on stochastic multiplication and arrest under the stress generated by the field. A critical transition in the dislocation population is suggested as the cause of protrusion formation leading to subsequent arcing. The model is studied using Monte Carlo simulations and theoretical analysis, yielding a simplified dependence of the breakdown rates on the electric field. These agree with experimental observations of field and temperature breakdown dependencies.

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  • Received 31 August 2017

DOI:https://doi.org/10.1103/PhysRevLett.120.124801

© 2018 American Physical Society

Physics Subject Headings (PhySH)

Accelerators & Beams

Authors & Affiliations

Eliyahu Zvi Engelberg, Yinon Ashkenazy, and Michael Assaf

  • Racah Institute of Physics and the Center for Nanoscience and Nanotechnology, Hebrew University of Jerusalem, Jerusalem 9190401, Israel

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Issue

Vol. 120, Iss. 12 — 23 March 2018

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