Direct Measurement of Lateral Correlations under Controlled Nanoconfinement

P. Kékicheff, J. Iss, P. Fontaine, and A. Johner
Phys. Rev. Lett. 120, 118001 – Published 15 March 2018

Abstract

Lateral correlations along hydrophobic surfaces whose separation can be varied continuously are measured by x-ray scattering using a modified surface force apparatus coupled with synchrotron radiation, named SFAX. A weak isotropic diffuse scattering along the equatorial plane is revealed for mica surfaces rendered hydrophobic and charge neutral by immersion in cationic surfactant solutions at low concentrations. The peak corresponds to a lateral surface correlation length ξ12nm, without long-range order. These findings are compatible with the atomic force microscopy imaging of a single surface, where adsorbed surfactant stripes appear surrounded by bare mica zones. Remarkably, the scattering patterns remain stable for gap widths D larger than the lateral period but change in intensity and shape (to a lesser extent) as soon as D<ξ. This evolution codes for a redistribution of counterions (counterion release from antagonistic patches) and the associated new x-ray labeling of the patterns. The redistribution of counterions is also the key mechanism to the long-range electrostatic attraction between similar, overall charge-neutral walls, reported earlier.

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  • Received 7 July 2017

DOI:https://doi.org/10.1103/PhysRevLett.120.118001

© 2018 American Physical Society

Physics Subject Headings (PhySH)

Polymers & Soft Matter

Authors & Affiliations

P. Kékicheff1,2,*, J. Iss1, P. Fontaine2, and A. Johner1

  • 1Institut Charles Sadron, Université de Strasbourg, CNRS UPR22, 23 rue du Loess 67034 Strasbourg cedex 2, France
  • 2Synchrotron SOLEIL, Saint Aubin, 91192 Gif-sur-Yvette, France

  • *patrick.kekicheff@ics-cnrs.unistra.fr

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Issue

Vol. 120, Iss. 11 — 16 March 2018

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