Short Ballistic Josephson Coupling in Planar Graphene Junctions with Inhomogeneous Carrier Doping

Jinho Park, Jae Hyeong Lee, Gil-Ho Lee, Yositake Takane, Ken-Ichiro Imura, Takashi Taniguchi, Kenji Watanabe, and Hu-Jong Lee
Phys. Rev. Lett. 120, 077701 – Published 16 February 2018
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Abstract

We report on short ballistic (SB) Josephson coupling in junctions embedded in a planar heterostructure of graphene. Ballistic Josephson coupling is confirmed by the Fabry-Perot-type interference of the junction critical current Ic. The product of Ic and the normal-state junction resistance RN, normalized by the zero-temperature gap energy Δ0 of the superconducting electrodes, turns out to be exceptionally large close to 2, an indication of strong Josephson coupling in the SB junction limit. However, Ic shows a temperature dependence that is inconsistent with the conventional short-junction-like behavior based on the standard Kulik-Omel’yanchuk prediction. We argue that this feature stems from the effects of inhomogeneous carrier doping in graphene near the superconducting contacts, although the junction is in fact in the short-junction limit.

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  • Received 30 November 2017

DOI:https://doi.org/10.1103/PhysRevLett.120.077701

© 2018 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Jinho Park1, Jae Hyeong Lee1, Gil-Ho Lee1, Yositake Takane2, Ken-Ichiro Imura2, Takashi Taniguchi3, Kenji Watanabe3, and Hu-Jong Lee1,*

  • 1Department of Physics, Pohang University of Science and Technology, Pohang 37673, Korea
  • 2Department of Quantum Matter, AdSM, Hiroshima University, Higashi-Hiroshima 739-8530, Japan
  • 3National Institute for Materials Science, Tsukuba 305-0044, Japan

  • *To whom all correspondence should be addressed. hjlee@postech.ac.kr

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Issue

Vol. 120, Iss. 7 — 16 February 2018

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