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Dimensional Crossover-Induced Topological Hall Effect in a Magnetic Topological Insulator

Chang Liu, Yunyi Zang, Wei Ruan, Yan Gong, Ke He, Xucun Ma, Qi-Kun Xue, and Yayu Wang
Phys. Rev. Lett. 119, 176809 – Published 27 October 2017
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Abstract

We report transport studies of Mn-doped Bi2Te3 topological insulator (TI) films with an accurately controlled thickness grown by molecular beam epitaxy. We find that films thicker than five quintuple layers (QLs) exhibit the usual anomalous Hall effect for magnetic TIs. When the thickness is reduced to four QLs, however, characteristic features associated with the topological Hall effect (THE) emerge. More surprisingly, the THE vanishes again when the film thickness is further reduced to three QLs. Theoretical calculations demonstrate that the coupling between the top and bottom surface states at the dimensional crossover regime stabilizes the magnetic Skyrmion structure that is responsible for the THE.

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  • Received 19 February 2017

DOI:https://doi.org/10.1103/PhysRevLett.119.176809

© 2017 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Chang Liu1, Yunyi Zang1, Wei Ruan1, Yan Gong1, Ke He1,2,*, Xucun Ma1,2, Qi-Kun Xue1,2, and Yayu Wang1,2,†

  • 1State Key Laboratory of Low Dimensional Quantum Physics, Department of Physics, Tsinghua University, Beijing 100084, People’s Republic of China
  • 2Collaborative Innovation Center of Quantum Matter, Beijing 100084, China

  • *kehe@tsinghua.edu.cn
  • yayuwang@tsinghua.edu.cn

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Issue

Vol. 119, Iss. 17 — 27 October 2017

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