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Submolecular Resolution by Variation of the Inelastic Electron Tunneling Spectroscopy Amplitude and its Relation to the AFM/STM Signal

Bruno de la Torre, Martin Švec, Giuseppe Foti, Ondřej Krejčí, Prokop Hapala, Aran Garcia-Lekue, Thomas Frederiksen, Radek Zbořil, Andres Arnau, Héctor Vázquez, and Pavel Jelínek
Phys. Rev. Lett. 119, 166001 – Published 16 October 2017
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Abstract

Here we show scanning tunneling microscopy (STM), noncontact atomic force microscopy (AFM), and inelastic electron tunneling spectroscopy (IETS) measurements on an organic molecule with a CO-terminated tip at 5 K. The high-resolution contrast observed simultaneously in all channels unambiguously demonstrates the common imaging mechanism in STM/AFM/IETS, related to the lateral bending of the CO-functionalized tip. The IETS spectroscopy reveals that the submolecular contrast at 5 K consists of both renormalization of vibrational frequency and variation of the amplitude of the IETS signal. This finding is also corroborated by first principles simulations. We extend accordingly the probe-particle AFM/STM/IETS model to include these two main ingredients necessary to reproduce the high-resolution IETS contrast. We also employ the first principles simulations to get more insight into a different response of frustrated translation and rotational modes of the CO tip during imaging.

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  • Received 29 June 2017

DOI:https://doi.org/10.1103/PhysRevLett.119.166001

Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI.

© 2017 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Bruno de la Torre1,2,*, Martin Švec1,2, Giuseppe Foti1, Ondřej Krejčí1,3, Prokop Hapala1, Aran Garcia-Lekue4,5, Thomas Frederiksen4,5, Radek Zbořil2, Andres Arnau4, Héctor Vázquez1, and Pavel Jelínek1,2,4,†

  • 1Institute of Physics, Academy of Sciences of the Czech Republic, v.v.i., Cukrovarnická 10, 162 00 Prague, Czech Republic
  • 2Regional Centre of Advanced Technologies and Materials, Palacký University, Šlechtitelů 27, 78371 Olomouc, Czech Republic
  • 3Faculty of Mathematics and Physics, Department of Surface and Plasma Science, Charles University, V Holešovičkách 2, 180 00 Prague, Czech Republic
  • 4Donostia International Physics Center (DIPC), Paseo Manuel Lardizabal 4, E-20018 San Sebastian, Spain
  • 5Ikerbasque, Basque Foundation for Science, 48013 Bilbao, Spain

  • *bdelatorre@fzu.cz
  • jelinekp@fzu.cz

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Vol. 119, Iss. 16 — 20 October 2017

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