Dominance of Metric Correlations in Two-Dimensional Neuronal Cultures Described through a Random Field Ising Model

Lluís Hernández-Navarro, Javier G. Orlandi, Benedetta Cerruti, Eduard Vives, and Jordi Soriano
Phys. Rev. Lett. 118, 208101 – Published 18 May 2017
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Abstract

We introduce a novel random field Ising model, grounded on experimental observations, to assess the importance of metric correlations in cortical circuits in vitro. Metric correlations arise from both the finite axonal length and the heterogeneity in the spatial arrangement of neurons. The experiments consider the response of neuronal cultures to an external electric stimulation for a gradually weaker connectivity strength between neurons, and in cultures with different spatial configurations. The model can be analytically solved in the metric-free, mean-field scenario. The presence of metric correlations precipitates a strong deviation from the mean field. Null models of the same networks that preserve the distribution of connections recover the mean field. Our results show that metric-inherited correlations in spatial networks dominate the connectivity blueprint, mask the actual distribution of connections, and may emerge as the asset that shapes network dynamics.

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  • Received 1 June 2016

DOI:https://doi.org/10.1103/PhysRevLett.118.208101

© 2017 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied PhysicsInterdisciplinary PhysicsNonlinear DynamicsStatistical Physics & ThermodynamicsPhysics of Living SystemsNetworks

Authors & Affiliations

Lluís Hernández-Navarro1,2, Javier G. Orlandi1,3, Benedetta Cerruti1,4, Eduard Vives1,2, and Jordi Soriano1,2,*

  • 1Departament de Física de la Matèria Condensada, Universitat de Barcelona, Barcelona 08028, Catalonia, Spain
  • 2Universitat de Barcelona Institute of Complex Systems (UBICS), Barcelona, Catalonia, Spain
  • 3Complexity Science Group, Department of Physics and Astronomy, University of Calgary, Calgary, Canada T2N 1N4
  • 4Center for Genomic Science of IIT@SEMM, Istituto Italiano di Tecnologia (IIT), 20139 Milan, Italy

  • *jordi.soriano@ub.edu

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Issue

Vol. 118, Iss. 20 — 19 May 2017

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