Improved Sensing with a Single Qubit

P. Sekatski, M. Skotiniotis, and W. Dür
Phys. Rev. Lett. 118, 170801 – Published 26 April 2017
PDFHTMLExport Citation

Abstract

We consider quantum metrology with arbitrary prior knowledge of the parameter. We demonstrate that a single sensing two-level system can act as a virtual multilevel system that offers increased sensitivity in a Bayesian single-shot metrology scenario, and that allows one to estimate (arbitrary) large parameter values by avoiding phase wraps. This is achieved by making use of additional degrees of freedom or auxiliary systems not participating in the sensing process. The joint system is manipulated by intermediate control operations in such a way that an effective Hamiltonian, with an arbitrary spectrum, is generated that mimics the spectrum of a multisystem interacting with the field. We show how to use additional internal degrees of freedom of a single trapped ion to achieve a high-sensitivity magnetic field sensor for fields with arbitrary prior knowledge.

  • Figure
  • Received 10 August 2016

DOI:https://doi.org/10.1103/PhysRevLett.118.170801

© 2017 American Physical Society

Physics Subject Headings (PhySH)

Quantum Information, Science & Technology

Authors & Affiliations

P. Sekatski1, M. Skotiniotis2, and W. Dür1

  • 1Institut für Theoretische Physik, Universität Innsbruck, Technikerstr. 21a, A-6020 Innsbruck, Austria
  • 2Física Teòrica: Informació i Fenòmens Quàntics, Departament de Física, Universitat Autònoma de Barcelona, 08193 Bellaterra, Spain

Article Text (Subscription Required)

Click to Expand

Supplemental Material (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 118, Iss. 17 — 28 April 2017

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×