Quantitative STEM Imaging of Order-Disorder Phenomena in Double Perovskite Thin Films

B. D. Esser, A. J. Hauser, R. E. A. Williams, L. J. Allen, P. M. Woodward, F. Y. Yang, and D. W. McComb
Phys. Rev. Lett. 117, 176101 – Published 20 October 2016

Abstract

Using aberration-corrected high-angle annular dark field scanning transmission electron microscopy (HAADF-STEM), we investigate ordering phenomena in epitaxial thin films of the double perovskite Sr2CrReO6. Experimental and simulated imaging and diffraction are used to identify antiphase domains in the films. Image simulation provides insight into the effects of atomic-scale ordering along the beam direction on HAADF-STEM intensity. We show that probe channeling results in ±20% variation in intensity for a given composition, allowing 3D ordering information to be probed using quantitative STEM.

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  • Received 8 June 2016

DOI:https://doi.org/10.1103/PhysRevLett.117.176101

© 2016 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

B. D. Esser1, A. J. Hauser2, R. E. A. Williams1, L. J. Allen3, P. M. Woodward4, F. Y. Yang2, and D. W. McComb1

  • 1Department of Materials Science and Engineering, The Ohio State University, Columbus, Ohio 43210, USA
  • 2Department of Physics, The Ohio State University, Columbus, Ohio 43210, USA
  • 3School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia
  • 4Department of Chemistry, The Ohio State University, Columbus, Ohio 43210, USA

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Issue

Vol. 117, Iss. 17 — 21 October 2016

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