Abstract
Using aberration-corrected high-angle annular dark field scanning transmission electron microscopy (HAADF-STEM), we investigate ordering phenomena in epitaxial thin films of the double perovskite . Experimental and simulated imaging and diffraction are used to identify antiphase domains in the films. Image simulation provides insight into the effects of atomic-scale ordering along the beam direction on HAADF-STEM intensity. We show that probe channeling results in variation in intensity for a given composition, allowing 3D ordering information to be probed using quantitative STEM.
- Received 8 June 2016
DOI:https://doi.org/10.1103/PhysRevLett.117.176101
© 2016 American Physical Society