Orbital Selectivity in Scanning Tunneling Microscopy: Distance-Dependent Tunneling Process Observed in Iron Nitride

Y. Takahashi, T. Miyamachi, K. Ienaga, N. Kawamura, A. Ernst, and F. Komori
Phys. Rev. Lett. 116, 056802 – Published 5 February 2016
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Abstract

In scanning tunneling microscopy, orbital selectivity of the tunneling process can make the topographic image dependent on a tip-surface distance. We have found reproducible dependence of the images on the distance for a monatomic layer of iron nitride formed on a Cu(001) surface. Observed atomic images systematically change between a regular dot array and a dimerized structure depending on the tip-surface distance, which turns out to be the only relevant parameter in the image variation. An accompanied change in the weight of Fe3d local density of states to a tunneling background was detected in dI/dV spectra. These have been attributed to a shift in surface orbitals detected by the tip from the d states to the s/p states with increasing the tip-surface distance, consistent with an orbital assignment from first-principles calculations.

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  • Received 26 May 2015

DOI:https://doi.org/10.1103/PhysRevLett.116.056802

© 2016 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Y. Takahashi1, T. Miyamachi1,*, K. Ienaga1, N. Kawamura1,2, A. Ernst3, and F. Komori1

  • 1Institute for Solid State Physics, University of Tokyo, Kashiwa, Chiba 277-8581, Japan
  • 2Science & Technology Research Laboratories, NHK, Setagaya, Tokyo 157-8510, Japan
  • 3Max-Planck-Institut für Mikrostrukturphysik, Weinberg 2, 06120 Halle, Germany

  • *toshio.miyamachi@issp.u-tokyo.ac.jp

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Issue

Vol. 116, Iss. 5 — 5 February 2016

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