Long Lifetime Hole Traps at Grain Boundaries in CdTe Thin-Film Photovoltaics

B. G. Mendis, D. Gachet, J. D. Major, and K. Durose
Phys. Rev. Lett. 115, 218701 – Published 18 November 2015
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Abstract

A novel time-resolved cathodoluminescence method, where a pulsed electron beam is generated via the photoelectric effect, is used to probe individual CdTe grain boundaries. Excitons have a short lifetime (100ps) within the grains and are rapidly quenched at the grain boundary. However, a 47meV shallow acceptor, believed to be due to oxygen, can act as a long lifetime hole trap, even at the grain boundaries where their concentration is higher. This provides direct evidence supporting recent observations of hopping conduction across grain boundaries in highly doped CdTe at low temperature.

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  • Received 25 June 2015

DOI:https://doi.org/10.1103/PhysRevLett.115.218701

© 2015 American Physical Society

Authors & Affiliations

B. G. Mendis1,*, D. Gachet2, J. D. Major3, and K. Durose3

  • 1Deptartment of Physics, Durham University, South Road, Durham DH1 3LE, United Kingdom
  • 2Attolight AG, EPFL Innovation Square, Building D, 1015 Lausanne, Switzerland
  • 3Stephenson Institute for Renewable Energy, University of Liverpool, Chadwick Building, Liverpool L69 7ZF, United Kingdom

  • *Corresponding author. b.g.mendis@durham.ac.uk

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Vol. 115, Iss. 21 — 20 November 2015

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