Determination of Formation and Ionization Energies of Charged Defects in Two-Dimensional Materials

Dan Wang, Dong Han, Xian-Bin Li, Sheng-Yi Xie, Nian-Ke Chen, Wei Quan Tian, Damien West, Hong-Bo Sun, and S. B. Zhang
Phys. Rev. Lett. 114, 196801 – Published 12 May 2015
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Abstract

We present a simple and efficient approach to evaluate the formation energy and, in particular, the ionization energy (IE) of charged defects in two-dimensional (2D) systems using the supercell approximation. So far, first-principles results for such systems can scatter widely due to the divergence of the Coulomb energy with vacuum dimension, denoted here as Lz. Numerous attempts have been made in the past to fix the problem under various approximations. Here, we show that the problem can be resolved without any such assumption, and a converged IE can be obtained by an extrapolation of the asymptotic IE expression at large Lz (with a fixed lateral area S) back to the value at Lz=0. Application to defects in monolayer boron nitride reveal that defects in 2D systems can be unexpectedly deep, much deeper than the bulk.

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  • Received 12 September 2014

DOI:https://doi.org/10.1103/PhysRevLett.114.196801

© 2015 American Physical Society

Authors & Affiliations

Dan Wang1, Dong Han1,2, Xian-Bin Li1,*, Sheng-Yi Xie1, Nian-Ke Chen1, Wei Quan Tian1,3, Damien West2, Hong-Bo Sun1,†, and S. B. Zhang1,2,‡

  • 1State Key Laboratory on Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China
  • 2Department of Physics, Applied Physics, and Astronomy, Rensselaer Polytechnic Institute, Troy, New York 12180, USA
  • 3Institute of Theoretical Chemistry, Jilin University, Changchun 130012, China

  • *Corresponding author. lixianbin@jlu.edu.cn
  • Corresponding author. hbsun@jlu.edu.cn
  • Corresponding author. zhangs9@rpi.edu

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Vol. 114, Iss. 19 — 15 May 2015

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