Origin of High-Resolution IETS-STM Images of Organic Molecules with Functionalized Tips

Prokop Hapala, Ruslan Temirov, F. Stefan Tautz, and Pavel Jelínek
Phys. Rev. Lett. 113, 226101 – Published 25 November 2014; Erratum Phys. Rev. Lett. 115, 079903 (2015)
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Abstract

Recently, the family of high-resolution scanning probe imaging techniques using decorated tips has been complemented by a method based on inelastic electron tunneling spectroscopy (IETS). The new technique resolves the inner structure of organic molecules by mapping the vibrational energy of a single carbon monoxide (CO) molecule positioned at the apex of a scanning tunneling microscope (STM) tip. Here, we explain high-resolution IETS imaging by extending a model developed earlier for STM and atomic force microscopy (AFM) imaging with decorated tips. In particular, we show that the tip decorated with CO acts as a nanoscale sensor that changes the energy of its frustrated translation mode in response to changes of the local curvature of the surface potential. In addition, we show that high resolution AFM, STM, and IETS-STM images can deliver information about the charge distribution within molecules deposited on a surface. To demonstrate this, we extend our mechanical model by taking into account electrostatic forces acting on the decorated tip in the surface Hartree potential.

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  • Received 12 September 2014

DOI:https://doi.org/10.1103/PhysRevLett.113.226101

© 2014 American Physical Society

Erratum

Erratum: Origin of High-Resolution IETS-STM Images of Organic Molecules with Functionalized Tips [Phys. Rev. Lett. 113, 226101 (2014)]

Prokop Hapala, Ruslan Temirov, F. Stefan Tautz, and Pavel Jelínek
Phys. Rev. Lett. 115, 079903 (2015)

Authors & Affiliations

Prokop Hapala1,*, Ruslan Temirov2,3, F. Stefan Tautz2,3, and Pavel Jelínek1,4,†

  • 1Institute of Physics, Academy of Sciences of the Czech Republic, v.v.i., Cukrovarnická 10, 162 00 Prague, Czech Republic
  • 2Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, 52425 Jülich, Germany
  • 3Jülich Aachen Research Alliance (JARA)–Fundamentals of Future Information Technology, 52425 Jülich, Germany
  • 4Graduate School of Engineering, Osaka University 2-1, Yamada-Oka, Suita, Osaka 565-0871, Japan

  • *Corresponding author. hapala@fzu.cz
  • jelinkep@fzu.cz

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Issue

Vol. 113, Iss. 22 — 28 November 2014

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