Phase-Resolved Surface Plasmon Interferometry of Graphene

Justin A. Gerber, Samuel Berweger, Brian T. O’Callahan, and Markus B. Raschke
Phys. Rev. Lett. 113, 055502 – Published 30 July 2014
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Abstract

The surface plasmon polaritons (SPPs) of graphene reflect the microscopic spatial variations of underlying electronic structure and dynamics. Here, we excite and image the graphene SPP response in phase and amplitude by near-field interferometry. We develop an analytic cavity model that can self-consistently describe the SPP response function for edge, grain boundary, and defect SPP reflection and scattering. The derived SPP wave vector, damping, and carrier mobility agree with the results from more complex models. Spatial variations in the Fermi level and associated variations in dopant concentration reveal a nanoscale spatial inhomogeneity in the reduced conductivity at internal boundaries. The additional SPP phase information thus opens a new degree of freedom for spatial and spectral graphene SPP tuning and modulation for optoelectronics applications.

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  • Received 7 February 2014

DOI:https://doi.org/10.1103/PhysRevLett.113.055502

© 2014 American Physical Society

Authors & Affiliations

Justin A. Gerber, Samuel Berweger*, Brian T. O’Callahan, and Markus B. Raschke

  • Department of Physics, Department of Chemistry, and JILA, University of Colorado, Boulder, Colorado 80309, USA

  • *Present address: National Institute of Standards and Technology, Boulder, CO 80305, USA.
  • markus.raschke@colorado.edu

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Issue

Vol. 113, Iss. 5 — 1 August 2014

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