Influence of Contact-Line Curvature on the Evaporation of Nanodroplets from Solid Substrates

Jianguo Zhang, Frédéric Leroy, and Florian Müller-Plathe
Phys. Rev. Lett. 113, 046101 – Published 21 July 2014
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Abstract

The effect of the three-phase contact-line curvature on the evaporation mechanism of nanoscopic droplets from smooth and chemically homogenous substrates is studied by molecular dynamics simulations. Spherical droplets, whose three-phase contact line is curved, and cylindrical droplets, whose contact radius is infinite, are compared. It is found that the evaporation of cylindrical droplets takes place at constant contact angle, while spherical droplets evaporate by simultaneous reduction of their contact area and their contact angle. This is independent of the substrate-liquid interaction strength. The dependence of the evaporation mechanism on the contact-line curvature can be rationalized with the help of the concept of a contact-line tension, and the evaporation simulations of the spherical droplets are used to extract the line tension on each surface. The corresponding values for the Lennard-Jones systems studied here are of the order of 1011N, which is in a good agreement with previous theoretical and experimental estimates. With this order of magnitude, the line tension is expected to have an effect on the contact angle of spherical droplets only, when their diameter is less than about 100 nm. The observed difference in evaporation mechanism is interpreted as a manifestation of the line tension whose existence has been controversial.

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  • Received 20 January 2014

DOI:https://doi.org/10.1103/PhysRevLett.113.046101

© 2014 American Physical Society

Authors & Affiliations

Jianguo Zhang*, Frédéric Leroy, and Florian Müller-Plathe

  • Eduard-Zintl-Institut für Anorganische und Physikalische Chemie and Center of Smart Interfaces, Technische Universität Darmstadt, Alarich-Weiss-Straße 4, D-64287 Darmstadt, Germany

  • *j.zhang@theo.chemie.tu-darmstadt.de

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Issue

Vol. 113, Iss. 4 — 25 July 2014

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