Comley et al. Reply:

A. J. Comley, B. R. Maddox, R. E. Rudd, N. R. Barton, C. E. Wehrenberg, S. T. Prisbrey, J. A. Hawreliak, D. A. Orlikowski, S. C. Peterson, J. H. Satcher, A. J. Elsholz, H.-S. Park, B. A. Remington, N. Bazin, J. M. Foster, P. Graham, N. Park, P. A. Rosen, S. D. Rothman, A. Higginbotham, M. Suggit, and J. S. Wark
Phys. Rev. Lett. 113, 039602 – Published 14 July 2014

Abstract

  • Received 20 March 2014

DOI:https://doi.org/10.1103/PhysRevLett.113.039602

© 2014 Published by the American Physical Society

Authors & Affiliations

A. J. Comley1,2, B. R. Maddox1, R. E. Rudd1, N. R. Barton1, C. E. Wehrenberg1, S. T. Prisbrey1, J. A. Hawreliak1, D. A. Orlikowski1, S. C. Peterson1, J. H. Satcher1, A. J. Elsholz1, H.-S. Park1, B. A. Remington1, N. Bazin2, J. M. Foster2, P. Graham2, N. Park2, P. A. Rosen2, S. D. Rothman2, A. Higginbotham3, M. Suggit3, and J. S. Wark3

  • 1Lawrence Livermore National Lab, Livermore, California 94550, USA
  • 2Atomic Weapons Establishment, Aldermaston, Reading RG7 4PR, United Kingdom
  • 3Department of Physics, Clarendon Laboratory, University of Oxford, Parks Road, Oxford OX1 3PU, United Kingdom

Comments & Replies

Article Text (Subscription Required)

Click to Expand

Original Article

Strength of Shock-Loaded Single-Crystal Tantalum [100] Determined using In Situ Broadband X-Ray Laue Diffraction

A. J. Comley, B. R. Maddox, R. E. Rudd, S. T. Prisbrey, J. A. Hawreliak, D. A. Orlikowski, S. C. Peterson, J. H. Satcher, A. J. Elsholz, H.-S. Park, B. A. Remington, N. Bazin, J. M. Foster, P. Graham, N. Park, P. A. Rosen, S. R. Rothman, A. Higginbotham, M. Suggit, and J. S. Wark
Phys. Rev. Lett. 110, 115501 (2013)

References (Subscription Required)

Click to Expand
Issue

Vol. 113, Iss. 3 — 18 July 2014

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×