Comment on “Strength of Shock-Loaded Single-Crystal Tantalum [100] Determined Using in situ Broadband X-Ray Laue Diffraction”

Abigail Hunter and Dean L. Preston
Phys. Rev. Lett. 113, 039601 – Published 14 July 2014

Abstract

A Comment on the Letter by A. J. Comley et al., Phys. Rev. Lett. 110, 115501 (2013). The authors of the Letter offer a Reply.

  • Received 4 October 2013

DOI:https://doi.org/10.1103/PhysRevLett.113.039601

© 2014 American Physical Society

Authors & Affiliations

Abigail Hunter and Dean L. Preston*

  • Los Alamos National Laboratory Los Alamos, New Mexico 87545, USA

  • *dean@lanl.gov

Comments & Replies

Comley et al. Reply:

A. J. Comley, B. R. Maddox, R. E. Rudd, N. R. Barton, C. E. Wehrenberg, S. T. Prisbrey, J. A. Hawreliak, D. A. Orlikowski, S. C. Peterson, J. H. Satcher, A. J. Elsholz, H.-S. Park, B. A. Remington, N. Bazin, J. M. Foster, P. Graham, N. Park, P. A. Rosen, S. D. Rothman, A. Higginbotham, M. Suggit, and J. S. Wark
Phys. Rev. Lett. 113, 039602 (2014)

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Original Article

Strength of Shock-Loaded Single-Crystal Tantalum [100] Determined using In Situ Broadband X-Ray Laue Diffraction

A. J. Comley, B. R. Maddox, R. E. Rudd, S. T. Prisbrey, J. A. Hawreliak, D. A. Orlikowski, S. C. Peterson, J. H. Satcher, A. J. Elsholz, H.-S. Park, B. A. Remington, N. Bazin, J. M. Foster, P. Graham, N. Park, P. A. Rosen, S. R. Rothman, A. Higginbotham, M. Suggit, and J. S. Wark
Phys. Rev. Lett. 110, 115501 (2013)

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Issue

Vol. 113, Iss. 3 — 18 July 2014

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