Multiple Scattering Tomography

Peter Modregger, Matias Kagias, Silvia Peter, Matteo Abis, Vitaliy A. Guzenko, Christian David, and Marco Stampanoni
Phys. Rev. Lett. 113, 020801 – Published 11 July 2014

Abstract

Multiple scattering represents a challenge for numerous modern tomographic imaging techniques. In this Letter, we derive an appropriate line integral that allows for the tomographic reconstruction of angular resolved scattering distributions, even in the presence of multiple scattering. The line integral is applicable to a wide range of imaging techniques utilizing various kinds of probes. Here, we use x-ray grating interferometry to experimentally validate the framework and to demonstrate additional structural sensitivity, which exemplifies the impact of multiple scattering tomography.

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  • Received 10 January 2014

DOI:https://doi.org/10.1103/PhysRevLett.113.020801

© 2014 American Physical Society

Authors & Affiliations

Peter Modregger1,2,*, Matias Kagias1,3, Silvia Peter1,3, Matteo Abis1,3, Vitaliy A. Guzenko4, Christian David4, and Marco Stampanoni1,3

  • 1Swiss Light Source, Paul Scherrer Institut, 5232 Villigen, Switzerland
  • 2Centre d’Imagerie BioMédicale, École Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland
  • 3Institute for Biomedical Engineering, UZH/ETH Zürich, 8092 Zürich, Switzerland
  • 4Laboratory for Micro- and Nanotechnology, Paul Scherrer Institut, 5232 Villigen, Switzerland

  • *peter.modregger@psi.ch

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Vol. 113, Iss. 2 — 11 July 2014

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