Theoretical Analysis of a Dual-Probe Scanning Tunneling Microscope Setup on Graphene

Mikkel Settnes, Stephen R. Power, Dirch H. Petersen, and Antti-Pekka Jauho
Phys. Rev. Lett. 112, 096801 – Published 4 March 2014

Abstract

Experimental advances allow for the inclusion of multiple probes to measure the transport properties of a sample surface. We develop a theory of dual-probe scanning tunneling microscopy using a Green’s function formalism, and apply it to graphene. Sampling the local conduction properties at finite length scales yields real space conductance maps which show anisotropy for pristine graphene systems and quantum interference effects in the presence of isolated impurities. Spectral signatures in the Fourier transforms of real space conductance maps include characteristics that can be related to different scattering processes. We compute the conductance maps of graphene systems with different edge geometries or height fluctuations to determine the effects of nonideal graphene samples on dual-probe measurements.

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  • Received 16 October 2013

DOI:https://doi.org/10.1103/PhysRevLett.112.096801

© 2014 American Physical Society

Authors & Affiliations

Mikkel Settnes*, Stephen R. Power, Dirch H. Petersen, and Antti-Pekka Jauho

  • Center for Nanostructured Graphene (CNG), Department of Micro- and Nanotechnology Engineering, Technical University of Denmark, DK-2800 Kongens Lyngby, Denmark

  • *mikse@nanotech.dtu.dk

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Vol. 112, Iss. 9 — 7 March 2014

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