Demonstration of a Dressed-State Phase Gate for Trapped Ions

T. R. Tan, J. P. Gaebler, R. Bowler, Y. Lin, J. D. Jost, D. Leibfried, and D. J. Wineland
Phys. Rev. Lett. 110, 263002 – Published 26 June 2013

Abstract

We demonstrate a trapped-ion entangling-gate scheme proposed by Bermudez et al. [Phys. Rev. A 85, 040302 (2012)]. Simultaneous excitation of a strong carrier and a single-sideband transition enables deterministic creation of entangled states. The method works for magnetic field-insensitive states, is robust against thermal excitations, includes dynamical decoupling from qubit dephasing errors, and provides simplifications in experimental implementation compared to some other entangling gates with trapped ions. We achieve a Bell state fidelity of 0.974(4) and identify the main sources of error.

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  • Received 16 January 2013

DOI:https://doi.org/10.1103/PhysRevLett.110.263002

Published by the American Physical Society

Authors & Affiliations

T. R. Tan*, J. P. Gaebler, R. Bowler, Y. Lin, J. D. Jost, D. Leibfried, and D. J. Wineland

  • National Institute of Standards and Technology, 325 Broadway, Boulder, Colorado 80305, USA

  • *tingrei.tan@nist.gov
  • Present address: École Polytechnique Fédérale de Lausanne, Lausanne, Switzerland.

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Issue

Vol. 110, Iss. 26 — 28 June 2013

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