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Ciliary White Light: Optical Aspect of Ultrashort Laser Ablation on Transparent Dielectrics

Yi Liu, Yohann Brelet, Zhanbing He, Linwei Yu, Sergey Mitryukovskiy, Aurélien Houard, Benjamin Forestier, Arnaud Couairon, and André Mysyrowicz
Phys. Rev. Lett. 110, 097601 – Published 1 March 2013
Physics logo See Focus story: Rainbow Pattern May Allow Laser Damage Monitoring

Abstract

We report on a novel nonlinear optical phenomenon, coined as ciliary white light, during laser ablation of transparent dielectrics. It is observed in 14 different transparent materials including glasses, crystals, and polymers. This phenomenon is also universal with respect to laser polarization, pulse duration, and focusing geometry. We interpret its formation in terms of the nonlinear diffraction of the laser generated white light by the ablation crater covered by nanostructures. It carries rich information on the damage profile and morphology dynamics of the ablated surface, providing a real time in situ observation of the laser ablation process.

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  • Received 5 September 2012

DOI:https://doi.org/10.1103/PhysRevLett.110.097601

© 2013 American Physical Society

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Rainbow Pattern May Allow Laser Damage Monitoring

Published 1 March 2013

Intense light pulses that can precisely sculpt solid materials also generate dazzling rainbow patterns that reveal information about the surface.

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Authors & Affiliations

Yi Liu1,*, Yohann Brelet2, Zhanbing He2, Linwei Yu3, Sergey Mitryukovskiy1, Aurélien Houard1, Benjamin Forestier1, Arnaud Couairon4, and André Mysyrowicz1

  • 1Laboratoire d’Optique Appliquée, ENSTA/CNRS/Ecole Polytechnique, 828, Boulevard des Maréchaux, Palaiseau F-91762, France
  • 2Electron Microscopy for Materials Research (EMAT), University of Antwerp, Groenenborgerlaan 171, Antwerp B-2020, Belgium
  • 3Laboratoire de Physique des Interfaces et des Couches Minces, Ecole Polytechnique, CNRS, Palaiseau F-91128, France
  • 4Centre de Physique Théorique, Ecole Polytechnique, CNRS, Palaiseau F-91128, France

  • *Corresponding author. yi.liu@ensta-paristech.fr

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Issue

Vol. 110, Iss. 9 — 1 March 2013

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