Publisher’s Note: Unraveling the Intrinsic and Robust Nature of van Hove Singularities in Twisted Bilayer Graphene by Scanning Tunneling Microscopy and Theoretical Analysis [Phys. Rev. Lett. 109, 196802 (2012)]

I. Brihuega, P. Mallet, H. González-Herrero, G. Trambly de Laissardière, M. M. Ugeda, L. Magaud, J. M. Gómez-Rodríguez, F. Ynduráin, and J.-Y. Veuillen
Phys. Rev. Lett. 109, 209905 – Published 16 November 2012

Abstract

  • Received 9 November 2012

DOI:https://doi.org/10.1103/PhysRevLett.109.209905

© 2012 American Physical Society

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Original Article

Unraveling the Intrinsic and Robust Nature of van Hove Singularities in Twisted Bilayer Graphene by Scanning Tunneling Microscopy and Theoretical Analysis

I. Brihuega, P. Mallet, H. González-Herrero, G. Trambly de Laissardière, M. M. Ugeda, L. Magaud, J. M. Gómez-Rodríguez, F. Ynduráin, and J.-Y. Veuillen
Phys. Rev. Lett. 109, 196802 (2012)
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Vol. 109, Iss. 20 — 16 November 2012

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