Surface-Emission Studies in a High-Field RF Gun based on Measurements of Field Emission and Schottky-Enabled Photoemission

H. Chen, Y. Du, W. Gai, A. Grudiev, J. Hua, W. Huang, J. G. Power, E. E. Wisniewski, W. Wuensch, C. Tang, L. Yan, and Y. You
Phys. Rev. Lett. 109, 204802 – Published 14 November 2012

Abstract

We report on investigations into the fundamental surface emission parameters, the geometric field enhancement factor (β) and the work function (ϕ), by making both field emission and Schottky-enabled photoemission measurements. The measurements were performed on a copper surface in the Tsinghua University S-band RF gun in two separate experiments. Fitting our data to the models for each experiment indicate that the traditionally assumed high value of β(50500) does not provide a plausible explanation of the data, but incorporating a low value of ϕ at some sites does. In addition, direct measurements of the surface conducted after the experiment show that β is on the order of a few, consistent with our understanding of the electron emission measurements. Thus we conclude that the dominant source of electron emission in high gradient RF cavities is due to low ϕ sites, as opposed to the conventionally assumed high β sites. The origin of low ϕ at these sites is unclear and should be the subject of further investigation.

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  • Received 6 June 2012

DOI:https://doi.org/10.1103/PhysRevLett.109.204802

© 2012 American Physical Society

Authors & Affiliations

H. Chen1, Y. Du1, W. Gai2, A. Grudiev3, J. Hua1, W. Huang1, J. G. Power2, E. E. Wisniewski2,4,*, W. Wuensch3, C. Tang1, L. Yan1, and Y. You1

  • 1Department of Engineering Physics, Tsinghua University, Beijing 100084, China
  • 2ANL/HEP, Argonne, Illinois 60439, USA
  • 3CERN, CH-1211 Geneva 23, Switzerland
  • 4IIT Chicago, Illinois 60616, USA

  • *ewisniew@hawk.iit.edu

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Vol. 109, Iss. 20 — 16 November 2012

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