Multiscaling Analysis of Ferroelectric Domain Wall Roughness

J. Guyonnet, E. Agoritsas, S. Bustingorry, T. Giamarchi, and P. Paruch
Phys. Rev. Lett. 109, 147601 – Published 2 October 2012

Abstract

Using multiscaling analysis, we compare the characteristic roughening of ferroelectric domain walls in Pb(Zr0.2Ti0.8)O3 thin films with numerical simulations of weakly pinned one-dimensional interfaces. Although at length scales up to LMA5μm the ferroelectric domain walls behave similarly to the numerical interfaces, showing a simple monoaffine scaling (with a well-defined roughness exponent ζ), we demonstrate more complex scaling at higher length scales, making the walls globally multiaffine (varying ζ at different observation length scales). The dominant contributions to this multiaffine scaling appear to be very localized variations in the disorder potential, possibly related to dislocation defects present in the substrate.

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  • Received 16 April 2012

DOI:https://doi.org/10.1103/PhysRevLett.109.147601

© 2012 American Physical Society

Authors & Affiliations

J. Guyonnet1,*, E. Agoritsas1, S. Bustingorry2, T. Giamarchi1, and P. Paruch1

  • 1DPMC-MaNEP, University of Geneva, 24 Quai Ernest Ansermet, 1211 Geneva 4, Switzerland
  • 2CONICET, Centro Atómico Bariloche, 8400 San Carlos de Bariloche, Río Negro, Argentina

  • *jill.guyonnet@unige.ch

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Vol. 109, Iss. 14 — 5 October 2012

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