Interfacial Alloy Hydride Destabilization in Mg/Pd Thin Films

C.-J. Chung, Sang-Chul Lee, James R. Groves, Edwin N. Brower, Robert Sinclair, and Bruce M. Clemens
Phys. Rev. Lett. 108, 106102 – Published 5 March 2012

Abstract

Recently, a large increase in the equilibrium hydrogen pressure has been reported for MG thin films capped with a Pd layer. We show that this increase is due to intermixing of Mg and Pd, as opposed to a strain effect as previously claimed. Transmission electron microscopy and depth profiling x-ray photoemission spectroscopy are used to directly measure interfacial intermixing between Mg and Pd, and we find that intermixing and equilibrium hydrogen pressure both increase with annealing. We present a thermodynamic model of the effect of alloying on equilibrium pressure, and find that the observed equilibrium pressure increase is consistent with the observed thickness of the intermixed region, which is of the order of a few nm. We also show that stress measured during hydrogenation corresponds to a negligible increase in equilibrium pressure.

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Received 9 November 2011

DOI:https://doi.org/10.1103/PhysRevLett.108.106102

© 2012 American Physical Society

Authors & Affiliations

C.-J. Chung, Sang-Chul Lee, James R. Groves, Edwin N. Brower, Robert Sinclair, and Bruce M. Clemens

  • Department of Materials Science and Engineering, Stanford University, Stanford, California 94305, USA

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 108, Iss. 10 — 9 March 2012

Reuse & Permissions
Access Options
CHORUS

Article Available via CHORUS

Download Accepted Manuscript
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×