Nanoscale Spin Wave Localization Using Ferromagnetic Resonance Force Microscopy

Han-Jong Chia, Feng Guo, L. M. Belova, and R. D. McMichael
Phys. Rev. Lett. 108, 087206 – Published 24 February 2012

Abstract

We use the dipolar fields from a magnetic cantilever tip to generate localized spin wave precession modes in an in-plane magnetized, thin ferromagnetic film. Multiple resonances from a series of localized modes are detected by ferromagnetic resonance force microscopy and reproduced by micromagnetic models that also reveal highly anisotropic mode profiles. Modeled scans of line defects using the lowest-frequency mode provide resolution predictions of (94.5±1.5)nm in the field direction, and (390±2)nm perpendicular to the field.

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  • Received 15 September 2011

DOI:https://doi.org/10.1103/PhysRevLett.108.087206

© 2012 American Physical Society

Authors & Affiliations

Han-Jong Chia1,2,*, Feng Guo1,2, L. M. Belova3, and R. D. McMichael1,†

  • 1Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA
  • 2Maryland Nanocenter, University of Maryland, College Park, Maryland 20742, USA
  • 3Department of Materials Science and Engineering, Royal Institute of Technology, 10044 Stockholm, Sweden

  • *hanjong.chia@nist.gov
  • robert.mcmichael@nist.gov

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Issue

Vol. 108, Iss. 8 — 24 February 2012

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