Abstract
We measured the chemical and magnetic depth profiles of a single crystalline (, , ) film grown on a substrate using x-ray reflectometry, electron microscopy, electron energy-loss spectroscopy, and polarized neutron reflectometry. Our data indicate that the film exhibits coexistence of different magnetic phases as a function of depth. The magnetic depth profile is correlated with a variation of chemical composition with depth. The thermal hysteresis of ferromagnetic order in the film suggests a first-order ferromagnetic transition at low temperatures.
- Received 19 July 2011
DOI:https://doi.org/10.1103/PhysRevLett.108.077207
© 2012 American Physical Society