Abstract
The strong-field induced decay of a doubly excited, transient Coulomb complex is explored by tracing correlated two-electron emission in nonsequential double ionization of Ar as a function of the carrier-envelope phase. Using pulses, electron emission is essentially confined to one optical cycle. Classical model calculations support that the intermediate Coulomb complex has lost memory of its formation dynamics and allows for a consistent, though model-dependent definition of “emission time,” empowering us to trace transition-state two-electron decay dynamics with sub-fs resolution. We find a most likely emission time difference of as.
- Received 11 August 2011
DOI:https://doi.org/10.1103/PhysRevLett.108.073003
© 2012 American Physical Society