Direct Measurement of the Growth Mode of Graphene on SiC(0001) and SiC(0001¯)

J. B. Hannon, M. Copel, and R. M. Tromp
Phys. Rev. Lett. 107, 166101 – Published 11 October 2011

Abstract

We have determined the growth mode of graphene on SiC(0001) and SiC(0001¯) using ultrathin, isotopically labeled SiC13 “marker layers” grown epitaxially on the SiC12 surfaces. Few-layer graphene overlayers were formed via thermal decomposition at elevated temperature. For both surface terminations (Si face and C face), we find that the C13 is located mainly in the outermost graphene layers, indicating that, during decomposition, new graphene layers form underneath existing ones.

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  • Received 23 June 2011

DOI:https://doi.org/10.1103/PhysRevLett.107.166101

© 2011 American Physical Society

Authors & Affiliations

J. B. Hannon, M. Copel, and R. M. Tromp

  • IBM Research Division, T.J. Watson Research Center, Yorktown Heights, New York 10598, USA

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Issue

Vol. 107, Iss. 16 — 14 October 2011

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