Electrostriction at the LaAlO3/SrTiO3 Interface

C. Cancellieri, D. Fontaine, S. Gariglio, N. Reyren, A. D. Caviglia, A. Fête, S. J. Leake, S. A. Pauli, P. R. Willmott, M. Stengel, Ph. Ghosez, and J.-M. Triscone
Phys. Rev. Lett. 107, 056102 – Published 28 July 2011
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Abstract

We present a direct comparison between experimental data and ab initio calculations for the electrostrictive effect in the polar LaAlO3 layer grown on SrTiO3 substrates. From the structural data, a complete screening of the LaAlO3 dipole field is observed for film thicknesses between 6 and 20 uc. For thinner films, an expansion of the c axis of 2% matching the theoretical predictions for an electrostrictive effect is observed experimentally.

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  • Received 18 February 2011

DOI:https://doi.org/10.1103/PhysRevLett.107.056102

© 2011 American Physical Society

Authors & Affiliations

C. Cancellieri1, D. Fontaine2, S. Gariglio1, N. Reyren1, A. D. Caviglia1, A. Fête1, S. J. Leake3, S. A. Pauli3, P. R. Willmott3, M. Stengel4, Ph. Ghosez2, and J.-M. Triscone1,*

  • 1DPMC, University of Geneva, 24 Quai Ernest-Ansermet, 1211 Geneva 4, Switzerland
  • 2Physique Théorique des Matériaux, Université de Liège, B-4000 Liège, Belgium
  • 3Swiss Light Source, Paul Scherrer Institut, CH-5232 Villigen, Switzerland
  • 4Institut de Ciència de Materials de Barcelona (ICMAB-CSIC), Campus UAB, 08193 Bellaterra, Spain

  • *claudia.cancellieri@psi.ch

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Issue

Vol. 107, Iss. 5 — 29 July 2011

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